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            • UL/IEC/ EN 60529 Test Probe Kits without thrust

              Product Description:UL / IEC / EN 60529 IEC61032 Test Probe Kits BND-TPK05Model:BND-TPK05Product DetailsThe BND-TPK-05 was designed to provide the probes required by UL / IEC / EN 60529, the IP Code standard. It includes the following:· IEC Jointed Finger Probe (w/ banana jack in handle) (BND-B)· 2.5 mm Test Rod (BND-C)· 1.0 mm Test Wire (BND-D)
              Description

              Product Description:

              UL / IEC / EN 60529 IEC61032 Test Probe Kits BND-TPK05

              Model:BND-TPK05


              Product Details

              The BND-TPK-05 was designed to provide the probes required by UL / IEC / EN 60529, the IP Code standard. It includes the following:

              · IEC Jointed Finger Probe (w/ banana jack in handle) (BND-B)

              · 2.5 mm Test Rod (BND-C)

              · 1.0 mm Test Wire (BND-D)

              · Test Sphere Probe with handle (BND-A)

              · Test Sphere Probe (small) (BND-2A)

              · Custom-cut padded carrying case

              · One year warranty

              Meets Requirements for Testing Standard(s) including but not limited to:IEC 60529EN 60529


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